dm3 file (Gatan’s format) that is properly calibrated in reciprocal space (see Gatan’s documentation). If you are using DM, then it is likely that this plugin will work right away, or will work with the help of your TEM technician. Most TEMs use Gatan’s Digital Micrograph software for image collection. You need to have a properly calibrated diffraction pattern for the calculations to work. This image is best saved as a jpeg first and then saved as a tiff if that is the preferred format. This is more suitable for publication, as it zooms to the measured region and makes the image square. The final mode is Overlay & Crop, which is more of a publication-ready mode that actually crops the diffraction pattern down to the size of the measured region. This helps determine which rings are the most intense in the patterns adding a data component that is sometimes lost in SAD analysis. For example, you may be deciding between two phases that have similar d-spacing lists, but different ring intensities. This visual correlation between d spacing and measured rings is useful for indexing diffraction patterns, because the TEM operator can subjectively take ring intensity into account. It also labels the rings and d-spacing measurements in the inset so that there is traceability between the calculated values and the measurements made using the circle tool. Overlay is the second mode, which draws the positions of the measurements made back onto the diffraction pattern image, and displays an inset with the calculated d-spacing values for each ring. There is also a 2% error column, which is just 2 % of d in angstroms. G is in nanometers and d is in Angstroms. The first, and most basic mode, is calculate where the calculated values for G and d are added to the imageJ Results window in new columns. This plugin has three different modes in which it can operate.

From G = 1/d in reciprocal space, the d-spacing is calculated for each measurement made. From the area measurement, the radius (G) is found. Use imageJ’s circle tool (shift + oval tool) to measure the spot/ring patterns concentric to the (000) direct beam. It is also remarkably easy to use, accurate, and robust for both spot and ring electron diffraction patterns. This plugin can be used to quickly calculate the interplanar spacing values (d) directly within imageJ without copying the results table to another program like Excel to then convert measurements into d-values, which saves you time. If you’d like to help, check out the how to help guide! Overview The content of this page has not been vetted since shifting away from MediaWiki.

Saed analysis